Genetic Analysis and Molecular Mapping of Durable Yellow and Leaf Rust Resistance In Hexaploid Wheat Line “Quaiu 3”.

Bhoja Basnet1, Amir Ibrahim1, Jackie Rudd2, Sybil Herrera-Foessel3, Julio Huerta-Espino3 and Ravi Singh3, (1)Texas A&M University, College Station, TX, (2)Texas Agrilife Research-Amarillo, Amarillo, TX, (3)Apdo Postal 6-641, CIMMYT, Mexico D.F., MEXICO