Abstract: A Combination of Classic and New Technologies to Map and Fine Map Aphid Resistance in Soybean. (ASA, CSSA and SSSA International Annual Meetings (2015))

65-4 A Combination of Classic and New Technologies to Map and Fine Map Aphid Resistance in Soybean.

See more from this Division: ASA Section: Agronomic Production Systems
See more from this Session: Applied Soybean Research: I (includes graduate student oral competition)

Monday, November 16, 2015: 12:45 PM

Minneapolis Convention Center, 102 A

Wenyan Du, Michigan State University, East Lansing, MI and Dechun Wang, Plant, Soil and Microbial Sciences, Michigan State University, East Lansing, MI

Audio File Recorded Presentation

Abstract:

A Combination of Classic and New Technologies to Map and Fine Map Aphid Resistance in Soybean

Wenyan Du, Michigan State University, East Lansing, MI

Dechun Wang, Michigan State University, East Lansing, MI

The soybean aphid has become one of the most devastating pests to soybean in North America since its invasion in 2000. Soybean breeders have been seeking resistance sources and incorporating them into elite cultivars ever since 2000. As technology keeps updating over time, the process of mapping the aphid resistance QTL and facilitating it into the breeding scheme has become faster and easier. The results of mapping and fine mapping soybean aphid resistance gene in PI567537 will be presented. Based on fine mapping results, marker-assisted selection (MAS) system was well established, making the breeding scheme much more efficient than ever before. The MAS system will be discussed as well. We will also discuss how the resistance source screening system and new technologies were incorporated (52K SNP Chip and next generation sequencing).

See more from this Division: ASA Section: Agronomic Production Systems
See more from this Session: Applied Soybean Research: I (includes graduate student oral competition)

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