Abstract Details

Parameterizing Bioeconomic Models of Soybean Pest/Pathogen Management with Small Plot Data.

Paul Mitchell, Agricultural and Applied Economics, University of Wisconsin-Madison, Madison, WI, Nicola Carey, Wysocki Produce Farm, Nekoosa, WI, Jaime Willbur, Plant Pathology, University of Wisconsin, Madison, WI and Damon L. Smith, Plant Pathology, University of Wisconsin-Madison, Madison, WI