Synthetic Derived Wheat: A Hope for Breaking the Yield Barrier in the U.S. Great Plains.

Synthetic Derived Wheat: A Hope for Breaking the Yield Barrier in the U.S. Great Plains Wheat (Triticum aestivum L.) is the most-widely cultivated and third most-important cereal grain in the world that contributes 19% calories and 21% protein to the world’s population. With the increase in global population, the demand for wheat could reach 900 million tons by 2050. However, narrow genetic base and continued pressure from abiotic and biotic stresses pose a tough challenge to achieving expected increase in grain yield. Research leading to the evolution of synthetic hexaploid wheat (Triticum durum x Aegilops tauschii) and synthetic derived wheat (SDW) (elite bread wheat X synthetic hexaploid wheat) provided a tremendous opportunity to improve wheat production. Multiple studies were conducted to characterize SDW lines for grain yield and yield components, resistance to green bug (Schizaphis graminum, Rond), leaf rust (Puccinia triticina), and stripe rust (Puccinia striiformis f.sp. Tritici) during 2012-2014 cropping season. Results showed that 1) SDW lines produced 10 to 25% higher grain yield than recurrent parents, 2) 31%, 84%, 30%, and 66% of lines in BS1 population showed low incidence of leaf rust, stripe rust, greenbug, and powdery mildew, respectively, and 3) Currently unknown but possibly novel sources of resistances are believed to have been introduced into susceptible elite wheat backgrounds. Genetic gain studies suggested there is more scope to improve grain yield by modifying selection intensity and by selective breeding. The best performing lines from this study are candidates for strategic improvement of wheat in the U.S. Great Plains region.