100492 Relating Surface Reflectance and Near-Surface Soil Moisture to Improve Ground Truth Calibration of Optical Remote Sensing.
Poster Number 348-100
See more from this Division: SSSA Division: Soil Physics and Hydrology
See more from this Session: Remote Sensing of Land Surface and Vadose Zone Hydrologic Processes Poster
Tuesday, November 8, 2016
Phoenix Convention Center North, Exhibit Hall CDE
Abstract:
Optical remote-sensing (RS) provides an exceedingly powerful means for monitoring spatial surface (skin) soil moisture distributions. However, the relatively small penetration depth of electromagnetic radiation within the optical domain (400-2500 nm) and limited near-surface resolution of moisture sensors employed for ground truth calibration of RS observations provide a challenge for accurate near-surface moisture estimations. To better understand the relationship between skin and near-surface soil moisture we employed a benchtop hyperspectral line-scan imaging system to generate high resolution surface reflectance maps during evaporation from a soil column instrumented with a novel time domain reflectometry (TDR) sensor array that allows monitoring of near surface moisture at 1-cm or better resolution. A recently developed physically-based model for skin soil moisture predictions from shortwave infrared reflectance was applied to estimate skin soil moisture from surface reflectance and to explore the relationship between skin and near-surface moisture distributions during soil drying. Preliminary results will be presented and the potential of obtained findings for ground truth calibration of RS observations will be discussed.
See more from this Division: SSSA Division: Soil Physics and Hydrology
See more from this Session: Remote Sensing of Land Surface and Vadose Zone Hydrologic Processes Poster
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