Recent advancements in instrumentation and techniques for quantitatively measuring soil properties and mapping those properties on the soil profile have opened up new possibilities for both statistical and process-oriented modeling of pedogenic processes. This session focuses on three areas: (1) Emerging technologies that allow soil profile properties to be described in new ways or in higher resolution than has been previously possible, (2) Application of these technologies to quantify uncertainty of soil profile properties, and (3) Advancements in the derivation of continuous depth functions, statistical approaches for predicting soil properties, and modeling pedogenic processes resulting from digital soil morphometric data.