Identifying the Genetic Loci Associated with Fruiting Efficiency and Yield Components in AGS2000/NC06-19896 DH Population Under Post Anthesis High Temperature Stress Conditions.

High temperature (HT) stress is a major limitation for wheat production in most of the wheat growing areas all over the world.Heat stress impacts plant metabolic and physiological processes in wheat, and ultimately reduces yield and quality. High temperature reduces sink strength by aborting growing kernels. Improving spike partitioning at post anthesis stage can improve sink strength. Identifying noble traits, such as fruiting efficiency (FE), and understanding underlying genetic mechanism could potentially improve sink strength in wheat under post anthesis high-temperature stress conditions. The main goal of this study is to identify the genetic mechanism that controls the FE in a doubled haploid population derived from AGS2000/NC06-19896under post-anthesis high-temperature stress. The population was characterized for FE, grain number, 1000-grain weight, chaff weight, spikeletspike^-1, spike m^-2, harvest index, and yield under high-temperature stress locations. Significant genetic variations for those traits were observed. Frequency distribution showed FE is under complex genetic control mechanism. Preliminary data showed a significant correlation between FE and grain number. Linkage mapping for FE and other traits are ongoing.The final results will help us to identify genotypes with higher fruiting efficiency under high-temperature stress and improve our understanding of the genetic mechanism, which will be a valuable source for future genetic improvement of the yield of wheat under high-temperature stress.