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Kranthi K. Potteti
University of Nevada Las VegasElectrical and Computer Engineering
Las Vegas, NV
USA 89154
Email: pottetik@unlv.nevada.edu
Papers:
8:45 AM, Duke Energy Convention Center, Room 232, Level 2
113-3 Synchrotron X-Ray Microtomography (XMT) – New Means to Quantify Root Induced Changes of Rhizosphere Physical Properties.