Identification of High Throughput SNP Markers for Grain Yield, Yield Components and Wsmv Resistance in Wheat.

Tremendous advances in marker technology, computational capability and statistics has enabled remarkable progress in high throughput genotyping to distinguish genomic regions controlling quantitative and qualitative traits. We used 90,000 genome-wide SNP markers from Illumina’s Infinium iSelect to genotype 152 wheat recombinant inbred lines (RIL) derived from the cross CO960293-2//TAM 111. The RIL were phenotyped for grain yield (GY), yield components, biomass and other secondary traits, under dryland and well-watered environments and screened for wheat streak mosaic virus (WSMV) resistance in the growth chamber. QTL for GY were mapped on chromosome 1A and 2B in both environments and several QTL for yield components co-localized with QTL for GY.  The Wsm2 gene conferring resistance to WSMV was mapped on 3BS and within 2 cM of the flanking SNP. Four of the fourteen flanking SNP identified were within 0.7 cM. Two markers tightly linked to Wsm2 gene were converted to Kompetitive Allele Specific Polymorphic (KASP) markers and validated in an independent population of resistant and susceptible wheat lines. This markers could be useful in combating WSMV and the selection based on the diagnostic markers has a potential to improve yield in wheat. QTL by QTL  and QTL by environment interactions will be analysed.